MIL STD 217 VS TELCORDIA SR 332 SERIES

So I can expect any die failure causes me to have a catatrophic event, and therefore a system failure. I don't know if they actually tested million parts or it was just a prediction/model, nevertheless I accept it. The vendor I speak of published a DPPM of their NAND flash to be 200. It is not the same as the 'probability that both components will fail at the same time' as you imply. Once you have that, there are numerous sources that will direct you to the correct way of calculating the system reliability.

MIL STD 217 VS TELCORDIA SR 332 SERIES

Are these 2 components active standby, static standby (kick in upon failure), in short you need to draw up a reliability block diagram showing the redundant components with the series and parallel branches. Still it is a lot more accurate than 'predicting' it based on any generic type prediction method such as MIL-HDBK-217, Prism, 217+ or Telcordia.Р”Р„s for two parts added for redundacy, your question is overly general to provide an answer as to the correct method. FIT is a reliability metric that you can get from the manufacturer, it is calculated from the number of parts failed during manufacturer's Life Test, the industry standard is to calculate the FIT at a 60% confidence level. In reliability it is assumed that all parts are defectless at time t=0. Most manufacturing defects are, at least theoretically, screened out by the various inspection and final test.

The simplest example a smeared marking is a defect and counted in the DPPM but has no reliability meaning. DPPM is a production metric that counts every defect some related to relaibility some not. There is no direct correlation between DPPM and relaibility (expressed as FIT). It seems you are mixing up some metrics that are related but not identical. Thanks in advance, any help is much appreciated. Can someone point me in the right direction to calculating the probability of two failures occurring in the one system? My dilema is figuring out what formulas can I use to calculate the correlation between DPPM and FIT data I have received and how can I determine my actual reliability with this system.Р”Р„lso, to prevent single event catastrophic failures we are placing a redundant component to act as a back-up in the event of a die/component failure. I plan on having 5000 devices in the field (440000 die) and these devices will be powered/running 24/7 in the field. Each component has 4 die (88 per system) that could fail. In the system, I have 22 components powered/running in parallel, with a published DPPM of 200 (40 DPPM for higher rated parts), and a published 9 FITs any failure causes a catastrophic failure in the system. I have performed an MTBF on my electronics during the design phase of the project but I have come to the realization that it did not accurately predict the actual reliability of the hardware, i.e the measured failures exceeded predicted failures in time.

My name is John and I am a new member and this is my first post so I hope I have chosen the correct forum. Hello forum members, I am glad I found this very informative web-site.

Mil-std-217 vs telcordia sr 332